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CEI EN 60749-3 PDF

CEI EN 60749-3 PDF

Name:
CEI EN 60749-3 PDF

Published Date:
10/01/2017

Status:
[ Active ]

Description:

Semiconductor devices - Mechanical and climatic test methods Part 3: External visual examination

Publisher:
Comitato Elettrotecnico Italiano

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Czech version):
200 business days
SKU:
cei-en-60749-3_2750997
Choose Document Language:
11.70 €
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The purpose of this part of IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance.


Edition : 17
File Size : 1 file , 740 KB
Number of Pages : 20
Published : 10/01/2017

History

CEI EN 60749-3
CEI EN 60749-3
Published Date: 10/01/2017
Semiconductor devices - Mechanical and climatic test methods Part 3: External visual examination
11.70 €
CEI EN 60749-3
CEI EN 60749-3
Published Date: 03/01/2004
Semiconductor devices - Mechanical and climatic test method - Part 3: External visual inspection
4.50 €

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