CEI EN 60749-3 PDF

CEI EN 60749-3 PDF

Name:
CEI EN 60749-3 PDF

Published Date:
10/01/2017

Status:
[ Active ]

Description:

Semiconductor devices - Mechanical and climatic test methods Part 3: External visual examination

Publisher:
Comitato Elettrotecnico Italiano

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

The purpose of this part of IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance.

Edition :	17
File Size :	1 file , 740 KB
Number of Pages :	20
Published :	10/01/2017

History

Published Date: 10/01/2017

Semiconductor devices - Mechanical and climatic test methods Part 3: External visual examination

$11.7

Published Date: 03/01/2004

Semiconductor devices - Mechanical and climatic test method - Part 3: External visual inspection

$4.5

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