IEC 60749-10 Ed. 1.0 b COR. 1:2003 PDF

IEC 60749-10 Ed. 1.0 b COR. 1:2003 PDF

Name:
IEC 60749-10 Ed. 1.0 b COR. 1:2003 PDF

Published Date:
08/13/2003

Status:
Active

Description:

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Publisher:
International Electrotechnical Commission

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$Free Download
Need Help?

Edition : 1.0
File Size : 1 file , 58 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 1
Published : 08/13/2003

History


Related products

IEC 61190-1-3 Ed. 2.0 b:2007
Published Date: 04/26/2007
Attachment materials for electronic assembly - Part 1-3: Requirements for electronic grade solder alloys and fluxed and non-fluxed solid solders for electronic soldering applications
$70.5
IEC 60191-6-2 Ed. 1.0 b:2001
Published Date: 12/11/2001
Mechanical standardization of semiconductor devices - Part 6-2: General rules for the preparation of outline drawings of surface mounted semiconductor devices packages - Design guide for 1,50 mm, 1,27 mm and 1,00 mm pitch ball and column terminal packages
$15.3
IEC 61223-3-5 Ed. 2.0 b:2019
Published Date: 09/16/2019
Evaluation and routine testing in medical imaging departments - Part 3-5: Acceptance tests - Imaging performance of computed tomography X-ray equipment
$125.1

Best-Selling Products

IEEE/NACE 2655
Published Date:
IEEE/NACE Draft Standard Practice - Atmospheric Above Grade Inspection and Assessment of Corrosion on Steel Electrical Transmission, Distribution, and Substation Structures
IEEE/NACE P2655
Published Date: 01/01/2018
IEEE/NACE Approved Draft Standard - Atmospheric Above Grade Inspection and Assessment of Corrosion on Steel Electrical Transmission, Distribution, and Substation Structures
$17.1