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IEC 60749-13 Ed. 1.0 b:2002 PDF

IEC 60749-13 Ed. 1.0 b:2002 PDF

Name:
IEC 60749-13 Ed. 1.0 b:2002 PDF

Published Date:
04/12/2002

Status:
[ Withdrawn ]

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$6.9
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Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
Edition : 1.0
File Size : 1 file , 400 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 9
Published : 04/12/2002

History

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