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IEC 60749-17 Ed. 1.0 b:2003 PDF

IEC 60749-17 Ed. 1.0 b:2003 PDF

Name:
IEC 60749-17 Ed. 1.0 b:2003 PDF

Published Date:
02/20/2003

Status:
[ Withdrawn ]

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$6.9
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Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
Edition : 1.0
File Size : 1 file , 410 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 11
Published : 02/20/2003

History

IEC 60749-17 Ed. 2.0 b:2019
IEC 60749-17 Ed. 2.0 b:2019
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Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
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IEC 60749-17 Ed. 1.0 b:2003
IEC 60749-17 Ed. 1.0 b:2003
Published Date: 02/20/2003
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
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