IEC 60749-20-1 Ed. 2.0 b:2019 PDF

IEC 60749-20-1 Ed. 2.0 b:2019 PDF

Name:
IEC 60749-20-1 Ed. 2.0 b:2019 PDF

Published Date:
06/26/2019

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

Publisher:
International Electrotechnical Commission

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$98.7
Need Help?
IEC 60749-20-1:2019 applies to all non-hermetic SMD packages which are subjected to reflow solder processes and which are exposed to the ambient air. The purpose of this document is to provide SMD manufacturers and users with standardized methods for handling, packing, shipping, and use of moisture/reflow sensitive SMDs which have been classified to the levels defined in IEC 60749-20. These methods are provided to avoid damage from moisture absorption and exposure to solder reflow temperatures that can result in yield and reliability degradation. By using these procedures, safe and damage-free reflow can be achieved, with the dry packing process, providing a minimum shelf life capability in sealed dry-bags from the seal date.
Edition : 2.0
File Size : 1 file , 2.6 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 82
Published : 06/26/2019

History

IEC 60749-20-1 Ed. 3.0 b:2020
Published Date: 08/31/2020
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
$59.7
IEC 60749-20-1 Ed. 2.0 b:2019
Published Date: 06/26/2019
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
$98.7
IEC 60749-20-1 Ed. 1.0 b:2009
Published Date: 04/07/2009
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
$70.5

Related products

IEC 60191-2Z Ed. 1.0 b:2000
Published Date: 09/29/2000
Twenty-fourth supplement - Mechanical standardization of semiconductor devices - Part 2: Dimensions
$7.5
IEC 60749-2 Ed. 1.0 b:2002
Published Date: 04/12/2002
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
$7.5
IEC 60191-6-18 Ed. 1.0 b:2010
Published Date: 01/07/2010
Mechanical standardization of semiconductor devices - Part 6-18: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for ball grid array (BGA)
$43.5
IEC 60191-6-3 Ed. 1.0 b:2000
Published Date: 09/29/2000
Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)
$43.5

Best-Selling Products