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IEC 60749-27 Ed. 1.0 b:2003 PDF

IEC 60749-27 Ed. 1.0 b:2003 PDF

Name:
IEC 60749-27 Ed. 1.0 b:2003 PDF

Published Date:
10/21/2003

Status:
[ Withdrawn ]

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$14.7
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Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed. The testing shall be selected from this test method or the human body model (see IEC 60749-26).
Edition : 1.0
File Size : 1 file , 1.4 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 25
Published : 10/21/2003

History

IEC 60749-27 Ed. 2.0 b:2006
IEC 60749-27 Ed. 2.0 b:2006
Published Date: 07/18/2006
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
$28.5
IEC 60749-27 Ed. 1.0 b:2003
IEC 60749-27 Ed. 1.0 b:2003
Published Date: 10/21/2003
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
$14.7

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