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IEC 60749-32 Ed. 1.1 b:2010 PDF

IEC 60749-32 Ed. 1.1 b:2010 PDF

Name:
IEC 60749-32 Ed. 1.1 b:2010 PDF

Published Date:
11/29/2010

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) CONSOLIDATED EDITION

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$15.3
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IEC 60749-32:2002+A1:2010 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. This consolidated version consists of the first edition (2002) and its amendment 1 (2010). Therefore, no need to order amendment in addition to this publication.
Edition : 1.1
File Size : 1 file , 160 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 9
Published : 11/29/2010

History

IEC 60749-32 Ed. 1.1 b:2010
IEC 60749-32 Ed. 1.1 b:2010
Published Date: 11/29/2010
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) CONSOLIDATED EDITION
$15.3
IEC 60749-32 Ed. 1.0 b:2002
IEC 60749-32 Ed. 1.0 b:2002
Published Date: 08/30/2002
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
$7.5

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