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IEC 60749-32 Ed. 1.0 b:2002 PDF

IEC 60749-32 Ed. 1.0 b:2002 PDF

Name:
IEC 60749-32 Ed. 1.0 b:2002 PDF

Published Date:
08/30/2002

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$7.5
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Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.
Edition : 1.0
File Size : 1 file , 350 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 9
Published : 08/30/2002

History

IEC 60749-32 Ed. 1.1 b:2010
IEC 60749-32 Ed. 1.1 b:2010
Published Date: 11/29/2010
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) CONSOLIDATED EDITION
$15.3
IEC 60749-32 Ed. 1.0 b:2002
IEC 60749-32 Ed. 1.0 b:2002
Published Date: 08/30/2002
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
$7.5

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