IEC 60749-43 Ed. 1.0 b:2017 PDF

IEC 60749-43 Ed. 1.0 b:2017 PDF

Name:
IEC 60749-43 Ed. 1.0 b:2017 PDF

Published Date:
06/15/2017

Status:
[ Withdrawn ]

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

Publisher:
International Electrotechnical Commission

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$77.7
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IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
Edition : 1.0
File Size : 1 file , 1.1 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 74
Published : 06/15/2017

History


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