IEC 60749-8 Ed. 1.0 b:2002 PDF

IEC 60749-8 Ed. 1.0 b:2002 PDF

Name:
IEC 60749-8 Ed. 1.0 b:2002 PDF

Published Date:
08/30/2002

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Publisher:
International Electrotechnical Commission

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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Choose Document Language:
$28.5
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Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.
Edition : 1.0
File Size : 1 file , 560 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 31
Published : 08/30/2002

History


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