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IEC 62373-1 Ed. 1.0 b:2020 PDF

IEC 62373-1 Ed. 1.0 b:2020 PDF

Name:
IEC 62373-1 Ed. 1.0 b:2020 PDF

Published Date:
07/15/2020

Status:
Active

Description:

Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$57
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IEC 62373-1:2020 provides the measurement procedure for a fast BTI (bias temperature instability) test of silicon based metal-oxide semiconductor field-effect transistors (MOSFETs).

This document also defines the terms pertaining to the conventional BTI test method.
Edition : 1.0
File Size : 1 file , 1.7 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 44
Published : 07/15/2020

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