JEDEC JESD 22-A121A (R2014) PDF

JEDEC JESD 22-A121A (R2014) PDF

Name:
JEDEC JESD 22-A121A (R2014) PDF

Published Date:
07/01/2008

Status:
Active

Description:

MEASURING WHISKER GROWTH ON TIN AND TIN ALLOY SURFACE FINISHES

Publisher:
JEDEC Solid State Technology Association

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$22.2
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The predominant terminal finishes on electronic components have been Sn-Pb alloys. As the industry moves toward Pb-free components and assembly processes, the predominant terminal finish materials will be pure Sn and alloys of Sn, including Sn-Bi and Sn-Ag. Pure Sn and Sn-based alloy electrodeposits and solder-dipped finishes may grow tin whiskers, which could electrically short across component terminals or break off the component and degrade the performance of electrical or mechanical parts.
File Size : 1 file , 930 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 31
Published : 07/01/2008

History


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