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JEDEC JESD 35-1 PDF

JEDEC JESD 35-1 PDF

Name:
JEDEC JESD 35-1 PDF

Published Date:
09/01/1995

Status:
Active

Description:

ADDENDUM No. 1 to JESD35 - GENERAL GUIDELINES FOR DESIGNING TEST STRUCTURES FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS

Publisher:
JEDEC Solid State Technology Association

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$20.1
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This addendum expands the usefulness of the Standard 35 (JESD35) by detailing the various sources of measurement error that could effect the test results obtained by the ramped tests described in JESD35. Each source of error is described and its implications on test structure design is noted. This addendum can be used as a guide when designing test structures for the qualification and characterization of thin oxide reliability, specifically, by implementing accelerated voltage or current ramp tests.
File Size : 1 file , 1 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 26
Published : 09/01/1995

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