JEDEC JESD 47G.01 PDF

JEDEC JESD 47G.01 PDF

Name:
JEDEC JESD 47G.01 PDF

Published Date:
04/01/2010

Status:
Active

Description:

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

Publisher:
JEDEC Solid State Technology Association

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Czech version):

200 business days

SKU:

jedec-jesd-47g-01_1762646

This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.

File Size :	1 file , 240 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	26
Published :	04/01/2010

History

Published Date: 12/01/2022

Stress-Test-Driven Qualification of Integrated Circuits

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JEDEC JESD47J.01

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Published Date: 09/01/2017

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Published Date: 04/01/2011

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Published Date: 02/01/2011

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JEDEC JESD 47G.01

JEDEC JESD 47G.01

Published Date: 04/01/2010

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

20.10 €

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