Name:
JEDEC JESD22-A108G PDF
Published Date:
11/01/2022
Status:
Active
Publisher:
JEDEC Solid State Technology Association
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices’ operating condition in an accelerated way, and is primarily for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as burn-in, may be used to screen for infant mortality-related failures. The detailed use and application of burn-in is outside the scope of this document.
| File Size : | 1 file , 310 KB |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 14 |
| Published : | 11/01/2022 |
