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JEDEC JESD 22-A108C PDF

JEDEC JESD 22-A108C PDF

Name:
JEDEC JESD 22-A108C PDF

Published Date:
06/01/2005

Status:
Active

Description:

TEMPERATURE, BIAS, AND OPERATING LIFE

Publisher:
JEDEC Solid State Technology Association

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$16.2
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A revised method for determining the effects of bias conditions and temperature, over time, on solid state devices is now available. Revision B of A108 includes low temperature operating life (LTOL) and high temperature gate bias (HTGB) stress conditions, revised cool down requirements for high temperature stress, and a procedure to follow if parts are not tested within the allowed time window.
File Size : 1 file , 79 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 13
Published : 06/01/2005

History

JEDEC JESD22-A108G
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Published Date: 11/01/2022
TEMPERATURE, BIAS, AND OPERATING LIFE
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JEDEC JESD22-A108F
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Published Date: 07/01/2017
TEMPERATURE, BIAS, AND OPERATING LIFE
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JEDEC JESD22-A108D
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Published Date: 11/01/2010
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JEDEC JESD 22-A108C
JEDEC JESD 22-A108C
Published Date: 06/01/2005
TEMPERATURE, BIAS, AND OPERATING LIFE
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