Name: JEDEC JESD 22-A108C PDF
Brand: JEDEC Solid State Technology Association
SKU: jedec-jesd-22-a108c_1762564
Price: 16.20 EUR
Availability: InStock

Name:
JEDEC JESD 22-A108C PDF

Published Date:
06/01/2005

Status:
Active

Description:

TEMPERATURE, BIAS, AND OPERATING LIFE

Publisher:
JEDEC Solid State Technology Association

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Czech version):

200 business days

SKU:

jedec-jesd-22-a108c_1762564

A revised method for determining the effects of bias conditions and temperature, over time, on solid state devices is now available. Revision B of A108 includes low temperature operating life (LTOL) and high temperature gate bias (HTGB) stress conditions, revised cool down requirements for high temperature stress, and a procedure to follow if parts are not tested within the allowed time window.

File Size :	1 file , 79 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	13
Published :	06/01/2005

JEDEC JESD 22-A108C PDF

TEMPERATURE, BIAS, AND OPERATING LIFE

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