TEMPERATURE, BIAS, AND OPERATING LIFE

Publisher:
JEDEC Solid State Technology Association

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices' operating condition in an accelerated way, and is primarily for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as burn-in, may be used to screen for infant mortality related failures. The detailed use and application of burn-in is outside the scope of this document.

File Size :	1 file , 50 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Published :	11/01/2010

JEDEC JESD22-A108D PDF

TEMPERATURE, BIAS, AND OPERATING LIFE

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