JEDEC JESD22-B112C PDF

JEDEC JESD22-B112C PDF

Name:
JEDEC JESD22-B112C PDF

Published Date:
11/01/2023

Status:
Active

Description:

Package Warpage Measurement of Surface-Mount Integrated Circuits at Elevated Temperature

Publisher:
JEDEC Solid State Technology Association

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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The purpose of this test method is to measure the deviation from uniform flatness of an integrated circuit package body for the range of thermal conditions experienced during the surface-mount soldering operation.


File Size : 1 file , 1.9 MB
Note : This product is unavailable in Russia, Belarus
Published : 11/01/2023

History

JEDEC JESD22-B112C
Published Date: 11/01/2023
Package Warpage Measurement of Surface-Mount Integrated Circuits at Elevated Temperature
Free Download
JEDEC JESD22-B112A
Published Date: 10/01/2009
PACKAGE WARPAGE MEASUREMENT OF SURFACE-MOUNT INTEGRATED CIRCUITS AT ELEVATED TEMPERATURE
$22.2

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