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JEDEC JESD51-1 PDF

JEDEC JESD51-1 PDF

Name:
JEDEC JESD51-1 PDF

Published Date:
12/01/1995

Status:
Active

Description:

INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)

Publisher:
JEDEC Solid State Technology Association

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$23.4
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The purpose of this test method is to define a standard Electrical Test Method (ETM) that can be used to determine the thermal characteristics of single integrated circuit devices housed in some form of electrical package. This method will provide a basis for comparison of different devices housed in the same electronic package or similar devices housed in different electronic packages.
File Size : 2 files , 2.1 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 36
Published : 12/01/1995

History

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