IN MANY MACHINE VISION APPLICATIONS, THE DESIGN AND CONFIGURATION OF ILLUMINATION AND OPTICS CAN BE IMPROVED WHEN THE REFLECTING CHARACTERISTICS OF THE SURFACE OF OBJECTS UNDER INSPECTION ARE KNOWN. THIS PAPER DEALS WITH A NEWLY DEVELOPED SCATTERING MEASUREMENT SYSTEM WHICH OBJECTIVELY PROVIDES THIS INFORMATION. THE KEY FEATURES ARE: AUTOMATIC FULL ANGULAR SCATTER MEASUREMENT ILLUMINATION ANGLE SCANNING, VARIOUS LIGHT SOURCES, SPECTRAL SCANNING, AND AUTOMIZED DATA ACQUISITION AND ELABORATION. BASED ON THE DATA OBTAINED, THE APPLICABILITY OF ILLUMINATION TECHNIQUES CAN BE DETERMINED AND THEY PROVIDE A TOOL FOR FINDING THE OPTIMAL LIGHTING SOLUTION. APART FROM MACHINE VISION, THE RESULTS ARE APPLICABLE TO MANY FIELDS IN OPTICS, SUCH AS DESIGN OF LASER SCANNERS FOR INSPECTON, LASER WELDING, INPUT TO OPTICAL DESIGN SOFTWARE, ETC.
| Number of Pages : | 15 |
| Published : | 06/01/1990 |
