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BS 09/30190356 DC PDF

BS 09/30190356 DC PDF

Name:
BS 09/30190356 DC PDF

Published Date:
03/24/2009

Status:
Active

Description:

BS EN 60749-40. Semiconductor devices. Mechanical and climatic test methods. Part 40. Board level drop test method using a strain gauge

Publisher:
BSI Group

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Cross References:
IEC 60749-10
IEC 60749-20
IEC 60749-20-1
IEC 60749-37


All current amendments available at time of purchase are included with the purchase of this document.
Number of Pages : 24
Published : 03/24/2009

History

BS 09/30190356 DC
BS 09/30190356 DC
Published Date: 03/24/2009
BS EN 60749-40. Semiconductor devices. Mechanical and climatic test methods. Part 40. Board level drop test method using a strain gauge

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