Name:
CEI EN 62047-11 PDF
Published Date:
04/01/2014
Status:
[ Active ]
Publisher:
Comitato Elettrotecnico Italiano
This part of IEC 62047 specifies the test method to measure the linear thermal expansion coefficients (CLTE) of thin free-standing solid (metallic, ceramic, polymeric etc.) microelectro- mechanical system (MEMS) materials with length between 0,1 mm and 1 mm and width between 10 μm and 1 mm and thickness between 0,1 μm and 1 mm, which are main structural materials used for MEMS, micromachines and others. This test method is applicable for the CLTE measurement in the temperature range from room temperature to 30 % of a material's melting temperature.
| Edition : | 14 |
| File Size : | 1 file , 1.4 MB |
| Number of Pages : | 26 |
| Published : | 04/01/2014 |