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ECIA EIA-364-25C PDF

ECIA EIA-364-25C PDF

Name:
ECIA EIA-364-25C PDF

Published Date:
05/01/1998

Status:
[ Revised ]

Description:

TP-25C Probe Damage Test Procedure for Electrical Connectors

Publisher:
Electronic Components Industry Association

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$2.4
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This standard establishes a test method to be followed for probe damage testing, intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. The purpose of this test is to simulate a form of field abuse of contacts during test by inserting probes into connector socket contacts.


ANSI : ANSI Approved
Edition : C
File Size : 1 file , 260 KB
Number of Pages : 9
Published : 05/01/1998

History

ECIA EIA-364-25E
ECIA EIA-364-25E
Published Date: 03/01/2017
TP-25E Probe Damage Test Procedure for Electrical Connectors
$23.7
ECIA EIA-364-25E
ECIA EIA-364-25E
Published Date: 03/01/2017
TP-25E Probe Damage Test Procedure for Electrical Connectors
$1.8
ECIA EIA-364-25D
ECIA EIA-364-25D
Published Date: 11/01/2010
TP-25D PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS
$1.5
ECIA EIA-364-25C
ECIA EIA-364-25C
Published Date: 05/01/1998
TP-25C Probe Damage Test Procedure for Electrical Connectors
$1.8
ECIA EIA-364-25C
ECIA EIA-364-25C
Published Date: 05/01/1998
TP-25C Probe Damage Test Procedure for Electrical Connectors
$2.4

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