ECIA EIA-364-25E PDF

ECIA EIA-364-25E PDF

Name:
ECIA EIA-364-25E PDF

Published Date:
03/01/2017

Status:
[ Revised ]

Description:

TP-25E Probe Damage Test Procedure for Electrical Connectors

Publisher:
Electronic Components Industry Association

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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ANSI APPROVED

This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. This test is to simulate a form of field abuse of contacts during test by inserting probes into socket contacts. The purpose of this test is as follows:

- to simulate probing of socket contacts while installed in the connector for non-removable contacts and for removable contacts while outside of the connector housing;

- to verify performance characteristics of the socket contacts have not been adversely impacted as may be specified in the referencing document (i.e. engagement and separation forces).


ANSI : ANSI Approved
Edition : E
File Size : 0 files
Number of Pages : 13
Published : 03/01/2017

History

ECIA EIA-364-25E
Published Date: 03/01/2017
TP-25E Probe Damage Test Procedure for Electrical Connectors
$23.7
ECIA EIA-364-25E
Published Date: 03/01/2017
TP-25E Probe Damage Test Procedure for Electrical Connectors
$1.8
ECIA EIA-364-25D
Published Date: 11/01/2010
TP-25D PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS
$1.5
ECIA EIA-364-25C
Published Date: 05/01/1998
TP-25C Probe Damage Test Procedure for Electrical Connectors
$1.8
ECIA EIA-364-25C
Published Date: 05/01/1998
TP-25C Probe Damage Test Procedure for Electrical Connectors
$2.4

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