ECIA EIA-364-25C PDF

Name:
ECIA EIA-364-25C PDF

Published Date:
05/01/1998

Status:
[ Revised ]

Description:

TP-25C Probe Damage Test Procedure for Electrical Connectors

Publisher:
Electronic Components Industry Association

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

This standard establishes a test method to be followed for probe damage testing, intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. The purpose of this test is to simulate a form of field abuse of contacts during test by inserting probes into connector socket contacts.

ANSI :	ANSI Approved
Edition :	C
File Size :	0 files
Number of Pages :	14
Published :	05/01/1998

History

ECIA EIA-364-25E

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ECIA EIA-364-25D

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TP-25D PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS

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ECIA EIA-364-25C

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TP-25C Probe Damage Test Procedure for Electrical Connectors

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ECIA EIA-364-25C

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TP-25C Probe Damage Test Procedure for Electrical Connectors

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