Name:
ECIA EIA-364-25E PDF
Published Date:
03/01/2017
Status:
[ Active ]
Publisher:
Electronic Components Industry Association
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. This test is to simulate a form of field abuse of contacts during test by inserting probes into socket contacts. The purpose of this test is as follows:
— to simulate probing of socket contacts while installed in the connector for non-removable contacts and for removable contacts while outside of the connector housing;
— to verify performance characteristics of the socket contacts have not been adversely impacted as may be specified in the referencing document (i.e. engagement and separation forces).
| ANSI : | ANSI Approved |
| Edition : | E |
| File Size : | 0 files |
| Number of Pages : | 13 |
| Published : | 03/01/2017 |