IEC 60749-16 Ed. 1.0 b:2003 PDF

Name:
IEC 60749-16 Ed. 1.0 b:2003 PDF

Published Date:
01/17/2003

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)

Publisher:
International Electrotechnical Commission

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Defines a test aiming at detecting the presence of loose particles inside a cavity device such as, for example, chips of ceramic, pieces of bonding wire or solder balls (prills).

Edition :	1.0
File Size :	1 file , 200 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	13
Published :	01/17/2003

History

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