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IEC 60749-16 Ed. 1.0 b:2003 PDF

IEC 60749-16 Ed. 1.0 b:2003 PDF

Name:
IEC 60749-16 Ed. 1.0 b:2003 PDF

Published Date:
01/17/2003

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$7.5
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Defines a test aiming at detecting the presence of loose particles inside a cavity device such as, for example, chips of ceramic, pieces of bonding wire or solder balls (prills).
Edition : 1.0
File Size : 1 file , 200 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 13
Published : 01/17/2003

History

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