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IEC 60749-18 Ed. 1.0 b:2002 PDF

IEC 60749-18 Ed. 1.0 b:2002 PDF

Name:
IEC 60749-18 Ed. 1.0 b:2002 PDF

Published Date:
12/13/2002

Status:
[ Withdrawn ]

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$24.6
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Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.
Edition : 1.0
File Size : 1 file , 560 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 27
Published : 12/13/2002

History

IEC 60749-18 Ed. 2.0 b:2019
IEC 60749-18 Ed. 2.0 b:2019
Published Date: 04/10/2019
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
$57
IEC 60749-18 Ed. 1.0 b:2002
IEC 60749-18 Ed. 1.0 b:2002
Published Date: 12/13/2002
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
$24.6

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