IEC 60749-27 Amd.1 Ed. 2.0 b:2012 PDF

Name:
IEC 60749-27 Amd.1 Ed. 2.0 b:2012 PDF

Published Date:
09/25/2012

Status:
Active

Description:

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Publisher:
International Electrotechnical Commission

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Edition :	2.0
File Size :	1 file , 150 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	5
Published :	09/25/2012

History

Related products

IEC 60191-6-3 Ed. 1.0 b:2000

Published Date: 09/29/2000

Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)

$43.5

IEC 60191-2V Ed. 1.0 b:1998

Published Date: 12/22/1998

Twentieth supplement

$15.3

IEC 60749-8 Ed. 1.0 b:2002

Published Date: 08/30/2002

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

$28.5

IEC 60191-6-6 Ed. 1.0 b:2001

Published Date: 03/22/2001

Mechanical standardization of semiconductor devices - Part 6-6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine pitch land grid array (FLGA)

$28.5

Best-Selling Products

Frontpage 98 for Windows : Visual Quickstart Guide

Published Date: 05/01/1998

$5.4

The Macintosh Bible

Published Date: 10/01/1998

$10.5