BS 07/30171395 DC PDF

Name:
BS 07/30171395 DC PDF

Published Date:
11/19/2007

Status:
Active

Description:

BS EN 62374-1. Semiconductor devices. Part 1. Time dependent dielectric breakdown test (TDDB)for inter-metal layers

Publisher:
BSI Group

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Cross References:
IEC-60747

All current amendments available at time of purchase are included with the purchase of this document.

Number of Pages :	15
Published :	11/19/2007

History

Related products

BS 9300 C678-721:1971

Published Date: 03/15/1971

Detail specification for silicon voltage regulator diodes

$92.964

BS 9300 C780-831:1971

Published Date: 01/15/1971

Detail specification for silicon voltage regulator diodes

$79.248

BS 9305 N042:1972

Published Date: 03/15/1972

Detail specification for silicon voltage regulator diodes. 1.5 W, 6.8 to 200 V (5%), hermetically sealed. General application category C

$57.15

Best-Selling Products

IETF 8254-2

Published Date: 07/01/2016

Papiers et cartons - Mesurage du brillant spéculaire - Partie 2: Brillant à 75° avec un faisceau parallèle, méthode DIN

$24.3

IETF FAA AC 43-10

Published Date: 02/01/1983

MECHANICAL WORK PERFORMED ON U.S. AND CANADIAN REGISTERED AIRCRAFT

IETF RFC 1000

Published Date: 08/01/1987

The Request for Comments Reference Guide

$21

IETF RFC 1002

Published Date: 03/01/1987

PROTOCOL STANDARD FOR A NetBIOS SERVICE ON A TCP/UDP TRANSPORT: DETAILED SPECIFICATIONS

$18.3

IETF RFC 1014

Published Date: 06/01/1987

XDR: EXTERNAL DATA REPRESENTATION STANDARD

IETF RFC 1042

Published Date: 02/01/1988

A Standard for the Transmission of IP Datagrams over IEEE 802 Networks

$10.2