Semiconductor devices. Mechanical and climatic test methods-Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
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Semiconductor devices. Mechanical and climatic test methods-Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
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Semiconductor devices. Mechanical and climatic test methods-Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level
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Semiconductor devices. Mechanical and climatic test methods-External visual examination
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Semiconductor devices. Mechanical and climatic test methods-External visual examination
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Semiconductor devices. Mechanical and climatic test methods-Preconditioning of non-hermetic surface mount devices prior to reliability testing
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Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing
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Semiconductor devices. Mechanical and climatic test methods-Flammability of plastic-encapsulated devices (internally induced)
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Semiconductor devices. Mechanical and climatic test methods. Flammability of plastic-encapsulated devices (externally induced)
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Semiconductor devices. Mechanical and climatic test methods-Accelerated moisture resistance. Unbiased autoclave
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